Want to know more about the most widely used and best known silicon probe for Atomic Force Microscopy and Scanning Probe Microscopy – the NanoWorld Pointprobe Series? Then you shouldn’t miss this interview with NanoWorld CEO Manfred Detterbeck.
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Researchers from the Physics Department at Durham University demonstrate an imaging technique using Atomic Force Microscopy in their JoVE Engineering publication.
For each step, the authors have explained the scientific rationale behind their choices to facilitate the adaptation of the methodology to every user’s specific system.
The NanoWorld Arrow-UHF AFM probe for high speed AFM is also mentioned in this publication.
Ethan J. Miller, William Trewby, Amir Farokh Payam, Luca Piantanida, Clodomiro Cafolla, Kislon Voïtchovsky, Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid (2016), JoVE, 1940-087X, doi:10.3791/54924
https://www.jove.com/video/54924/sub-nanometer-resolution-imaging-with-amplitude-modulation-atomic
Creative Commons Attribution
https://doi.org/10.3791/54924
Copyright © 2016 Creative Commons Attribution 3.0 License
nano tech 2017 show – Tokyo Big Sight, Japan
currently meeting customers at the nano tech 2017, the international nanotechnology exhibition and conference at Tokyo Big Sight, February 15 to February 17, 2017.
See you at booth 4s-27 of Toyo Corporation, our distributor in Japan!