NanoWorld EFM PtIr coated probes were used for the PFM measurements mentioned in this brand new publication on ferroelectric domain imaging of patterned BFO thin films in Scientific Reports.
Congratulations to the authors!
#afmprobes #atomicforcemicroscopy #afmtips #AFM
Bumsoo Kim, Frank P. Barrows, Yogesh Sharma, Ram S. Katiyar, Charudatta Phatak, Amanda K. Petford-Long, Seokwoo Jeon, Seungbum Hong
Resolved Piezoresponse Force Microscopy
Scientific Reports (2018) 8:20, DOI:10.1038/s41598-017-18482-9
For the full article please follow this external link:
This article is licensed under a Creative Commons Attribution 4.0 International
License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this
article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not per-
mitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/