This is what it looks like when we are celebrating the first successful test of a new AFM probe prototype in the AFM. Want to find out how the story continues? Stay tuned…
successful AFM probe prototype testing at NanoWorld
Category: News
NANOWORLD POINTPROBE® SUPERSHARPSILICON™ TIP (SSS) SCREENCAST
Check out our screencast about NanoWorld Pointprobe® SuperSharpSilicon™ (SSS) Tip.
It will give you an overview of our SuperSharpSilicon™ (SSS) tip which has been developed for enhanced resolution of microroughness and nanostructures.
SPECIAL TIP VERSIONS OF NANOWORLD POINTPROBE® SILICON AFM PROBES SCREENCAST
Check out our screencast about the Special Tip versions of our NanoWorld Pointprobe® Silicon AFM Probes Series.
It will give you an overview of 3 special tip versions based on our famous standard Pointprobe® tip:
- The SuperSharpSiliconTM Tip (SSS) for high resolution imaging
- The High Aspect Ratio Tip (AR5 / AR5T) for deep trench measurements
- The wear resistant Diamond Coated Tip (DT) and Conductive Diamond Coated Tip (CDT)