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NanoWorld AFM Probes
POINTPROBE® silicon AFM probes
Most widely used and best-known high quality SPM and
AFM probe world-wide

Our Pointprobe® is a versatile silicon AFM probe for very high resolution imaging and fits to all well-known commercial SPMs (Scanning Probe Microscopes). It consists of a single crystal silicon cantilever with integrated single crystal silicon tip. The cantilever and the tip are supported by a single crystal silicon holder. True atomic resolution has been achieved by several research facilities in UHV using our Non-Contact / TappingMode AFM probes NCH and NCL.

For detailed information see below:
  • General Description Pointprobe® Silicon-SPM-Probes
  • Special Versions
  • Available Coatings


  • AFM Probes Guide and AFM Probes Brochure are available for free download.

     

     
      Type Tip Side Coating Back Side Coating Special Force Constant Res. Frequency
    Contact mode CONT none, PtIr5 none, Reflex, PtIr5 n.a. 0.2 N/m 13 kHz
    Contact mode (Short Cantilever) CONTSC none none, Reflex n.a. 0.2 N/m 25 kHz
    Contact mode, Seiko or Zeiss ZEILR none Reflex n.a. 1.6 N/m 27 kHz
    Non-contact / tapping mode
    (high frequency)
    NCH none, PtIr5, Diamond, Conductive Diamond none, Reflex, PtIr5 AR5, AR10, AR5T
    SSS, PtIr5, DT, CDT
    42 N/m 330 kHz
    Non-contact / soft tapping NCST none none, Reflex n.a. 7.4 N/m 160 kHz
    Non-contact / tapping mode
    (long cantilever)
    NCL none, PtIr5, Diamond, Conductive Diamond none, PtIr5, Reflex SSS, AR5, DT, CDT 48 N/m 190 kHz
    Non-contact / tapping mode
    (Seiko non-contact mode)
    SEIHR none none, Reflex SSS 15 N/m 130 kHz
    Force modulation mode FM none, DT, CDT none, Reflex DT, CDT 2.8 N/m 75 kHz
    Electrostatic force microscopy EFM PtIr5 PtIr5 n.a. 2.8 N/m 75 kHz
    Magnetic force microscopy
    Hard magnetic (tipside)
    MFMR Hard Magnetic, Medium Momentum Reflex n.a. 2.8 N/m 75 kHz
    Magnetic force microscopy
    Soft magnetic (tipside)
    S-MFMR Soft Magnetic Reflex n.a. 2.8 N/m 75 kHz
    All data are subject to change without notice.
    All data are typical values, for guaranteed specifications see detailed description of probe type.

    In addition, special silicon AFM probes can be designed and manufactured upon customer's request.
    Please contact our development team at developers@nanoworld.com.

    SSS -> SuperSharpSilicon Tip
    AR5 -> High Aspect Ratio Tip (5:1)
    AR10 -> High Aspect Ratio (10:1)
    AR5T -> Tilt Compensated High Aspect Ratio Tip (5:1)
    DT -> Diamond Coated Tip
    CDT -> Conductive Diamond Coated Tip
    PtIr5 -> Platinum Iridium 5 Coating
    Reflex -> Aluminum Coating
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