POINTPROBE® silicon AFM probes
Most widely used and best-known high quality SPM and
AFM probe world-wide
Our Pointprobe® is a versatile silicon AFM probe for very high resolution imaging and fits to all well-known commercial SPMs (Scanning Probe Microscopes). It consists of a single crystal silicon cantilever with integrated single crystal silicon tip. The cantilever and the tip are supported by a single crystal silicon holder. True atomic resolution has been achieved by several research facilities in UHV using our Non-Contact / TappingMode AFM probes NCH and NCL.
For detailed information see below:
General Description Pointprobe® Silicon-SPM-Probes
Special Versions
Available Coatings
AFM Probes Guide and AFM Probes Brochure are available for free download.
|
|
Type
|
Reflex Coating
|
Special
|
Force Constant
|
Res. Frequency
|
|
Contact mode |
CONT |
None or reflex |
n.a. |
0.2 N/m |
13 kHz |
|
|
| Contact mode (Short Cantilever) |
CONTSC |
None or reflex |
n.a. |
0.2 N/m |
25 kHz |
|
|
|
Contact mode, Seiko or Zeiss |
ZEILR |
Reflex |
n.a. |
1.6 N/m |
27 kHz |
| Order code |
Coating |
|
| ZEILR |
Reflex |
Standard Tip Shape |
|
Non-contact / tapping mode
(high frequency) |
NCH |
None or reflex |
AR5, AR10, AR5T
SSS, PtIr5, DT, CDT |
42 N/m |
330 kHz |
|
|
| Non-contact / soft tapping
|
NCST |
None or reflex |
n.a. |
7.4 N/m |
160 kHz |
| Order code |
Coating |
|
| NCST |
none |
Standard Tip Shape |
| NCSTR |
Reflex |
Standard Tip Shape |
|
Non-contact / tapping mode
(long cantilever) |
NCL |
None or reflex |
SSS, AR5, DT, CDT |
48 N/m |
190 kHz |
| Order code |
Coating |
|
| NCL |
none |
Standard Tip Shape |
| NCLR |
Reflex |
Standard Tip Shape |
| NCLPt |
PtIr5 |
Standard Tip Shape |
| SSS-NCL |
none |
SuperSharpSilicon™ Tip |
| AR5-NCLR |
Reflex |
High Aspect Ratio Tip (5:1) |
| DT-NCLR |
Diamond (tipside) and Reflex (detector side) |
Diamond Coated Tip |
| CDT-NCLR |
Conductive Diamond (tipside) and Reflex (detector side) |
Conductive Diamond Coated Tip |
|
Non-contact / tapping mode
(Seiko non-contact mode) |
SEIHR |
Reflex |
SSS |
15 N/m |
130 kHz |
| Order code |
Coating |
|
| SSS-SEIH |
none |
SuperSharpSilicon™ Tip |
| SEIHR |
Reflex |
Standard Tip Shape |
|
|
Force modulation mode |
FM |
None or reflex |
DT, CDT |
2.8 N/m |
75 kHz |
| Order code |
Coating |
|
| FM |
none |
Standard Tip Shape |
| FMR |
Reflex |
Standard Tip Shape |
| DT-FMR |
Diamond (tipside) and Reflex (detector side) |
Diamond Coated Tip |
| CDT-FMR |
Conductive Diamond (tipside) and Reflex (detector side) |
Conductive Diamond Coated Tip |
|
|
Electrostatic force microscopy |
EFM |
n.a. |
n.a. |
2.8 N/m |
75 kHz |
| Order code |
Coating |
|
| EFM |
PtIr5 |
Standard Tip Shape |
|
Magnetic force microscopy
Hard magnetic (tipside) |
MFMR |
Reflex |
n.a. |
2.8 N/m |
75 kHz |
| Order code |
Coating |
|
| MFMR |
Hard Magnetic (tipside) and Reflex (detector side) |
Standard Tip Shape |
|
Magnetic force microscopy
Soft magnetic (tipside)
|
S-MFMR |
Reflex |
n.a. |
2.8 N/m |
75 kHz |
| Order code |
Coating |
|
| S-MFMR |
Reflex |
Standard Tip Shape |
|
All data are subject to change without notice.
All data are typical values, for guaranteed specifications see detailed description of probe type.
In addition, special silicon AFM probes can be designed and manufactured upon customer's request.
Please contact our development team at
developers@nanoworld.com.
SSS -> SuperSharpSilicon Tip
AR5 -> High Aspect Ratio Tip (5:1)
AR10 -> Heigh Aspect Ratio (10:1)
AR5T -> Tilt Compensated High Aspect Ratio Tip (5:1)
DT -> Diamond Coated Tip
CDT -> Conductive Diamond Coated Tip
PtIr5 -> Platinum Iridium 5 Coating
Reflex -> Aluminum Coating
