NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
Additionally this probe offers typical tip radius of curvature of less than 8 nm.
The reflex coating on the detector side of the cantilever enhances its reflectance and prevents light from interfering within the cantilever.
|Thickness||7.0 µm||6.5 - 7.5|
|Mean Width||38 µm||33 - 43|
|Length||225 µm||220 - 230|
|Force Constant||48 N/m||31 - 71|
|Resonance Frequency||190 kHz||160 - 210|
|Order Code||Quantity||Data Sheet|