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NanoWorld AFM Probes
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Home  ›  Probes Catalog  ›  Pointprobe®  ›  Non-Contact / Tapping Mode AFM Probes  ›  NCLR

Type: NCLR

Non-contact / Tapping™ mode -
Long Cantilever - Reflex coating

point probe afm tip
Cantilever Data ValueRange*
Resonance Frequency 190 kHz160 - 210
Force Constant 48 N/m31 - 71
Length 225 µm220 - 230
Mean Width 38 µm33 - 43
Thickness 7.0 µm6.5 - 7.5

Product Description

NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

Additionally, this probe offers typical tip radius of curvature of less than 8 nm.

A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Coating Description

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

Order Codes and Packages Sizes

 Order Code Quantity Data Sheet
NCLR-10 10 yes
NCLR-20 20 yes
NCLR-50 50 no
NCLR-W 380 yes

Product Screencast

Product Screencast on NanoWorld Pointprobe® Silicon AFM Probes (Standard Tip)
given by Dr. Marco Becker - Product Developer

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For more information contact: info@nanoworld.com
Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.
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