NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
Additionally this probe offers typical tip radius of curvature of less than 8 nm.
The reflex coating on the detector side of the cantilever enhances its reflectance and prevents light from interfering within the cantilever.
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 7.0 µm | 6.5 - 7.5 |
| Mean Width | 38 µm | 33 - 43 |
| Length | 225 µm | 220 - 230 |
| Force Constant | 48 N/m | 31 - 71 |
| Resonance Frequency | 190 kHz | 160 - 210 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| NCLR-10 | 10 | yes |
| NCLR-20 | 20 | yes |
| NCLR-50 | 50 | no |
| NCLR-W | 380 | yes |
| *Typical values | ||
