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NanoWorld AFM Probes
Pointprobe® Silicon AFM Probes General Description
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General

  • SPM and AFM probes for very high resolution imaging
  • fit to all well-known commercial SPMs and AFMs
  • cantilever and tip are supported by a single crystal silicon support chip
  • monolithic design of support chip, cantilever and tip

Material Features

  • highly doped, single crystal silicon (resistivity 0.01 - 0.025 Ohm•cm)
  • no intrinsic stress and absolutely straight cantilevers
  • chemically inert silicon for application in fluids or electrochemical cells

Cantilever

  • rectangular cantilever with trapezoidal cross section
  • wide detector side for easy laser beam adjustment
  • small width at the tip side reduces damping

Support Chip

  • cantilever is integrated into a silicon support chip
  • dimensions of the support chip are very reproducible (3.4 mm x 1.6 mm x 0.3 mm)
  • alignment grooves on the back side of the silicon support chip in conjunction with the alignment chip ensure replacement of the probes without major readjustment of the laser beam

Tip

  • tip is shaped like a polygon based pyramid
  • tip height 10-15 µm and radius of curvature typically < 8 nm (< 12 nm guaranteed)
  • macroscopic half cone angles :
        - 20° to 25° seen along the cantilever axis
        - 25° to 30° seen from the side

For detailed information about our AFM probe product series please see below:
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