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NanoWorld AFM Probes
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SEIKO INSTRUMENTS microscopes - Non-contact mode -
High force constant - Reflex coating

point probe afm tip
Cantilever Data ValueRange*
Resonance Frequency 130 kHz110 - 150
Force Constant 15 N/m9 - 25
Length 225 µm220 - 230
Mean Width 33 µm27.5 - 37.5
Thickness 5.0 µm4.5 - 5.5

Product Description

NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

Additionally, this probe offers typical tip radius of curvature of less than 8 nm.

A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Coating Description

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

Order Codes and Packages Sizes

 Order Code Quantity Data Sheet
SEIHR-10 10 yes
SEIHR-20 20 yes
SEIHR-50 50 no
SEIHR-W 380 yes

Product Screencast

Product Screencast on NanoWorld Pointprobe® Silicon AFM Probes (Standard Tip)
given by Dr. Marco Becker - Product Developer

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For more information contact:
Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.
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