NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
Additionally this probe offers typical tip radius of curvature of less than 8 nm.
The reflex coating on the detector side of the cantilever enhances its reflectance and prevents light from interfering within the cantilever.
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 5.0 µm | 4.5 - 5.5 |
| Mean Width | 33 µm | 27.5 - 37.5 |
| Length | 225 µm | 220 - 230 |
| Force Constant | 15 N/m | 9 - 25 |
| Resonance Frequency | 130 kHz | 110 - 150 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| SEIHR-10 | 10 | yes |
| SEIHR-20 | 20 | yes |
| SEIHR-50 | 50 | no |
| SEIHR-W | 380 | yes |
| *Typical values | ||
