Type: CDT-NCLR

Conductive Diamond coated AFM tip - Non-contact/Tapping™ mode - Long AFM Cantilever - Reflex coating

Logo
Cantilever Data Value Range*
Resonance Frequency 210 kHz 175 - 245 kHz
Force Constant 72 N/m 48 - 105 N/m
Length 225 µm 220 - 230 µm
Mean Width 37.5 µm 32.5 - 42.5 µm
Thickness 7 µm 6.5 - 7.5 µm

This AFM probe has alignment grooves on the back side of the support chip.

diamond coated tip

diamond coated tip

Product Description

NanoWorld® Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum AFM cantilever length (> 125 µm). This AFM probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

For applications that require hard contact between AFM tip and sample this AFM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.

The typical macroscopic AFM tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.

The CDT features a conductive diamond coating. Some typical applications for this AFM tip are Tunneling AFM (Conducting AFM) and Scanning Capacitance Microscopy (SCM).

For applications allowing higher resonance frequencies or a shorter AFM cantilever length we recommend our Pointprobe® type CDT-NCHR.

Image A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Standard

Coating: Diamond

Conductive Diamond Coating / Aluminum Reflex Coating

The conductive diamond coating consists of a 100 nm thick polycrystalline diamond layer deposited on the tip side of the AFM cantilever resulting in an unsurpassed hardness of the AFM tip. The coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm•cm.

The aluminum reflex coating deposited on the detector side of the AFM cantilever enhances the reflectance of the laser beam and prevents light from interfering within the AFM cantilever.

Order Codes

Order Code Quantity Data Sheet
CDT-NCLR-10 10 yes
CDT-NCLR-20 20 yes
CDT-NCLR-50 50 no

NanoWorld® Pointprobe® Diamond Coated AFM Tip (DT), Conductive Diamond Coated AFM Tip (CDT) Screencast

Subscribe to NanoWorld® Youtube Channel

Bruker® is a trademark of Bruker Corporation

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com

For detailed information about our AFM probe product series please see below: