NanoWorld AFM Probes Brochure:
Arrow™ Silicon AFM ProbesOptimized positioning through maximized tip visibility
Our Arrow™ probes are designed for easy tip positioning and high resolution imaging. They fit to all well-known commercial SPMs (Scanning Probe Microscopes). The AFM probe consists of a support chip with a cantilever which has a tetrahedral tip at its triangular free end.
The probe is entirely made of monolithic, highly doped silicon.
The unique Arrow™ shape of the cantilever allows easy positioning of the tip on the area of interest.
Furthermore the Arrow™ series also includes a range of tipless cantilevers and cantilever arrays.
You can find further information on the following page:
Complete NanoWorld AFM Probes Brochure available for download here
| Application | Type | Tip Side Coating | Detector Side Coating | Res. Frequency | Force Constant |
|---|---|---|---|---|---|
| Contact Mode | Arrow™ CONT | none | none | 14 kHz | 0.2 N/m |
| Arrow™ CONTR | none | Reflex (Al) | |||
| Arrow™ CONTPt | PtIr5 | PtIr5 | |||
| Non contact / tapping mode | Arrow™ NC | none | none | 285 kHz | 42 N/m |
| Arrow™ NCR | none | Reflex (Al) | |||
| Arrow™ NCPt | PtIr5 | PtIr5 | |||
| Non contact / tapping mode ultra high frequency |
Arrow™ UHF | none | Reflex (Al) | 2000 kHz | --- |
| Arrow™ UHFAuD | none | Reflex (Au) | |||
| Force modulation mode | Arrow™ FM | none | none | 75 kHz | 2.8 N/m |
| Arrow™ FMR | none | Reflex (Al) | |||
| Arrow™ EFM | PtIr5 | PtIr5 | |||
| Tipless cantilevers and cantilever arrays |
Arrow™ TL1 (1 cantilever) | none | none | 6 kHz | 0.03 N/m |
| Arrow™ TL1Au (1 cantilever) | Au | none | |||
| Arrow™ TL2 (2 cantilevers) | none | none | |||
| Arrow™ TL2Au (2 cantilevers) | Au | none | |||
| Arrow™ TL8 (8 cantilevers) | none | none | |||
| Arrow™ TL8Au (8 cantilevers) | Au | none |
All data are subject to change without notice.
All data are typical values, for guaranteed specifications see detailed description of probe type.
In addition, special silicon AFM probes can be designed and manufactured upon customer's request.
Please contact our development team at developers@nanoworld.com.
All data are typical values, for guaranteed specifications see detailed description of probe type.
In addition, special silicon AFM probes can be designed and manufactured upon customer's request.
Please contact our development team at developers@nanoworld.com.
For detailed information about our AFM probe product series please see below:
Pointprobe®
Ultra-Short Cantilevers
Pyrex-Nitride
Coatings
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