NanoWorld AFM Probes Brochure:
Arrow™ Silicon AFM Probes
Optimized positioning through maximized tip visibility
Optimized positioning through maximized tip visibility
Our new Arrow™ probes are designed for easy tip positioning and high resolution imaging. They fit to all well-known commercial SPMs (Scanning Probe Microscopes). The AFM probe consists of a holding chip with a cantilever which has a tetrahedral tip at its triangular free end.
The probe is entirely made of monolithic, highly doped silicon.
You can find further information on the following page:
Complete NanoWorld AFM Probes Brochure is available for download here.
| Application | Type | Tip Side Coating | Back Side Coating | Force Constant | Res. Frequency |
|---|---|---|---|---|---|
| Contact Mode | Arrow™ CONT | none | none | 0.2 N/m | 14 kHz |
| Arrow™ CONTR | none | Reflex | |||
| Arrow™ CONTPt | PtIr5 | PtIr5 | |||
| Non contact / tapping mode | Arrow™ NC | none | none | 42 N/m | 285 kHz |
| Arrow™ NCR | none | Reflex | |||
| Arrow™ NCPt | PtIr5 | PtIr5 | |||
| Non contact / tapping mode ultra high frequency |
Arrow™ UHF | none | Reflex | --- | 2000 kHz |
| Arrow™ UHFAuD | none | Gold | |||
| Force modulation mode | Arrow™ FM | none | none | 2.8 N/m | 75 kHz |
| Arrow™ FMR | none | Reflex | |||
| Arrow™ EFM | PtIr5 | PtIr5 | |||
| Tipless cantilevers and cantilever arrays |
Arrow™ TL1 (1 cantilever) | none | none | 0.03 N/m | 6 kHz |
| Arrow™ TL1Au (1 cantilever) | Gold | none | |||
| Arrow™ TL2 (2 cantilevers) | none | none | |||
| Arrow™ TL2Au (2 cantilevers) | Gold | none | |||
| Arrow™ TL8 (8 cantilevers) | none | none | |||
| Arrow™ TL8Au (8 cantilevers) | Gold | none |
All data are subject to change without notice.
All data are typical values, for guaranteed specifications see detailed description of probe type.
In addition, special silicon AFM probes can be designed and manufactured upon customer's request.
Please contact our development team at developers@nanoworld.com.
All data are typical values, for guaranteed specifications see detailed description of probe type.
In addition, special silicon AFM probes can be designed and manufactured upon customer's request.
Please contact our development team at developers@nanoworld.com.
Available Coatings for the Arrow™ series
Reflex Coating
- 30 nm thick Aluminum coating on the backside
- enhances reflectance of the laser beam by a factor of 2.5
- prevents light from interfering within the cantilever
PtIr5 Coating
- 25nm thick double layer of chromium and platinum iridium5
- layer on both sides of the product
- the layer enhances the conductivity and allows electrical contact
Other Coatings
The probes of the Arrow™ series can also be supplied with other proven coatings from thePointprobe® series (e.g. gold coating) upon request.
For availability and price please contact your local distributor.
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