Optimized positioning through maximized tip visibility
NanoWorld Arrow™ NC probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a height of 10 - 15 µm.
Additionally this probe offers a typical tip radius of curvature of less than 10 nm.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 4.6 µm | 4.1 - 5.1 |
Cantilever Geometry
|
W = 45 µm L = 160 µm | 40 - 50 155 - 165 |
| Force Constant | 42 N/m | 27 - 80 |
| Resonance Frequency | 285 kHz | 240 - 380 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| ARROW-NC-Sample | 2 | Nominal values |
| ARROW-NC-10 | 10 | Nominal values |
| ARROW-NC-20 | 20 | Nominal values |
| ARROW-NC-50 | 50 | Nominal values |
| ARROW-NC-W | 380 | Nominal values |
| *Typical values | ||
