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NanoWorld AFM Probes
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Type: Arrow™ NC

Non-contact / Tapping™ mode

Cantilever Data ValueRange*
Resonance Frequency 285 kHz240 - 380
Force Constant 42 N/m27 - 80
Length 160 µm155 - 165
Mean Width 45 µm40 - 50
Thickness 4.6 µm4.1 - 5.1

Product Description

Optimized positioning through maximized tip visibility

NanoWorld Arrow™ NC probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm.

Additionally, this probe offers a tip radius of curvature of less than 10 nm.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Order Codes and Packages Sizes

 Order Code Quantity Data Sheet
ARROW-NC-10 10 Nominal values
ARROW-NC-20 20 Nominal values
ARROW-NC-50 50 Nominal values
ARROW-NC-W 380 Nominal values

Product Screencast

Product Screencast on NanoWorld Arrow™ Silicon AFM Probes
given by Manfred Detterbeck - CEO NanoWorld AG

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For more information contact:
Arrow™ is a trademark of NanoWorld AG.
All data are subject to change without notice.
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