NanoWorld™ Pyrex-Nitride AFM probes are designed for various imaging applications in contact or dynamic mode. They fit to all well-known commercial SPMs (Scanning Probe Microscopes) and AFMs (Atomic Force Microscopes).
The NanoWorld™ Pyrex-Nitride AFM probes consist of silicon nitride cantilevers and tips supported by a holder chip made of borosilicate glass.
Currently three different versions of Pyrex-Nitride AFM Probes are available: probes with rectangular cantilevers, probes with triangular cantilevers and probes with triangular cantilevers without tips.
Complete NanoWorld AFM Probes Brochure is available for download here.
|Type||Cantilevers Type||Coating||Force Constant||Res. Frequency|
|PNP-DB (cantilever 1)||rectangular||Reflex (Cr/Au)||0.48 N/m||67 kHz|
|PNP-DB (cantilever 2)||rectangular||Reflex (Cr/Au)||0.06 N/m||17 kHz|
|PNP-TR (cantilever 1)||triangular||Reflex (Cr/Au)||0.32 N/m||67 kHz|
|PNP-TR (cantilever 2)||triangular||Reflex (Cr/Au)||0.08 N/m||17 kHz|
|PNP-TR-TL (cantilever 1)||triangular tipless||Reflex (Cr/Au)||0.32 N/m||67 kHz|
|PNP-TR-TL (cantilever 2)||triangular tipless||Reflex (Cr/Au)||0.08 N/m||17 kHz|
|PNP-TR-TL-Au (cantilever 1)||triangular tipless||Cr/Au both sides||0.32 N/m||67 kHz|
|PNP-TR-TL-Au (cantilever 2)||triangular tipless||Cr/Au both sides||0.08 N/m||17 kHz|