NanoWorld™ Pyrex-Nitride AFM probes are designed for various imaging applications in contact or dynamic mode. They fit to all well-known commercial SPMs (Scanning Probe Microscopes) and AFMs (Atomic Force Microscopes).
The NanoWorld™ Pyrex-Nitride AFM probes consist of silicon nitride cantilevers and tips supported by a holder chip made of borosilicate glass.
Currently three different versions of Pyrex-Nitride AFM Probes are available: probes with rectangular cantilevers, probes with triangular cantilevers and probes with triangular cantilevers without tips.
Complete NanoWorld AFM Probes Brochure is available for download here.
| Type | Cantilevers Type | Coating | Force Constant | Res. Frequency |
|---|---|---|---|---|
| PNP-DB (cantilever 1) | rectangular | Reflex (Cr/Au) | 0.48 N/m | 67 kHz |
| PNP-DB (cantilever 2) | rectangular | Reflex (Cr/Au) | 0.06 N/m | 17 kHz |
| PNP-TR (cantilever 1) | triangular | Reflex (Cr/Au) | 0.32 N/m | 67 kHz |
| PNP-TR (cantilever 2) | triangular | Reflex (Cr/Au) | 0.08 N/m | 17 kHz |
| PNP-TR-TL (cantilever 1) | triangular tipless | Reflex (Cr/Au) | 0.32 N/m | 67 kHz |
| PNP-TR-TL (cantilever 2) | triangular tipless | Reflex (Cr/Au) | 0.08 N/m | 17 kHz |
| PNP-TR-TL-Au (cantilever 1) | triangular tipless | Cr/Au both sides | 0.32 N/m | 67 kHz |
| PNP-TR-TL-Au (cantilever 2) | triangular tipless | Cr/Au both sides | 0.08 N/m | 17 kHz |
