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NanoWorld AFM Probes
Pyrex-Nitride AFM Probes
Leading edge in sharpness and durability


NanoWorld™ Pyrex-Nitride AFM probes are designed for various imaging applications in contact or dynamic mode. They fit to all well-known commercial SPMs (Scanning Probe Microscopes) and AFMs (Atomic Force Microscopes).

The NanoWorld™ Pyrex-Nitride AFM probes consist of silicon nitride cantilevers and tips supported by a support chip made of pyrex-glass.

Currently four different versions of Pyrex-Nitride AFM Probes are available: probes with rectangular cantilevers, probes with triangular cantilevers, probes with one single triangular cantilever for PeakForce Tapping™* and ScanAsyst®* and probes with triangular cantilevers without tips.

For detailed information see below:

  • General Description Pyrex-Nitride AFM Probes
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    Complete NanoWorld AFM Probes Brochure is available for download here.

     
    Application: Contact Mode or Tapping Mode
    Type Cantilever(s) Shape Tip Side Coating Detector Side Coating Res. Frequency Force Constant
    PNP-DB (cantilever 1) rectangular none Reflex (Au) 67 kHz 0.48 N/m
    PNP-DB (cantilever 2) rectangular none Reflex (Au) 17 kHz 0.06 N/m
    PNP-TR (cantilever 1) Triangular none Reflex (Au) 17 kHz 0.08 N/m
    PNP-TR (cantilever 2) Triangular none Reflex (Au) 67 kHz 0.32 N/m
    PNP-TR-Au (cantilever 1) Triangular Au Reflex (Au) 67 kHz 0.08 N/m
    PNP-TR-Au (cantilever 2) Triangular Au Reflex (Au) 17 kHz 0.32 N/m
    PNP-TRS (cantilever 1) Triangular none Reflex (Au) 67 kHz 0.32 N/m
    PNP-TR-TL (cantilever 1) Triangular tipless none Reflex (Au) 67 kHz 0.32 N/m
    PNP-TR-TL (cantilever 2) Triangular tipless none Reflex (Au) 17 kHz 0.08 N/m
    PNP-TR-TL-Au (cantilever 1) Triangular tipless Au Reflex (Au) 67 kHz 0.32 N/m
    PNP-TR-TL-Au (cantilever 2) Triangular tipless Au Reflex (Au) 17 kHz 0.08 N/m
    All data are subject to change without notice.
    All data are typical values, for guaranteed specifications see detailed description of AFM probe type.

    In addition, special silicon nitride AFM probes can be designed and manufactured upon customer's request.
    Please contact our development team at developers@nanoworld.com.

    PeakForce Tapping™ and ScanAsyst® are registered trademarks of Bruker Corporation
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