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NanoWorld AFM Probes
General Description Pyrex Nitride AFM Probes
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  • SPM and AFM probes for a wide range of applications in contact mode or dynamic mode
  • fit to all well-known commercial SPMs and AFMs
  • silicon nitride cantilevers and tips
  • cantilevers are supported by a support chip made of pyrex-glass
  • delivered as separated single support chips for easy handling

Material Features

  • low-stress silicon nitride for lowest cantilever bending
  • excellent hardness for wear resistance and extended lifetime


  • multi-lever design with either four rectangular cantilevers or four triangular cantilevers
  • single lever version with one triangular cantilever (for PeakForce Tapping™* and ScanAsyst®* modes)
  • reflective gold coating on the detector side of the cantilevers
  • stress compensated with bending below 2°

Support Chip

  • support chips made of pyrex-glass (3.4 mm x 1.6 mm x 0.5 mm)
  • easy handling due to single support chips


  • oxide sharpened pyramidal tips
  • tip height 3.5 µm and tip radius of curvature typically < 10 nm
  • macroscopic half cone angles 35°
*PeakForce Tapping™ and ScanAsyst® are registered trademarks of Bruker Corporation
For detailed information about our AFM probe product series please see below:
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