Leading edge in sharpness and durability
NanoWorld Pyrex-Nitride probes are designed for various imaging applications in contact or dynamic mode.
The Pyrex-Nitride probes have silicon nitride cantilevers with very low force constants and integrated oxide sharpened, pyramidal tips with a height of 3.5 µm. The tip is located 4 µm behind the free end of the cantilever. The probe series features a support chip that is made of Pyrex. The TR series features two different triangular cantilevers. Both sides of the chip have identical cantilevers. All cantilevers are stress compensated and have a 65 nm chromium / gold backside coating for high laser reflectance.
All chips are pre-separated prior to shipment and come in Gel-Pak containers.
The typical tip radius of curvature is below 10 nm. The cantilever bending is below 2°.
|Overall Thickness**||0.6 µm||0.6 µm|
|Width||2 X 13.5 µm||2 X 28 µm|
|Length||100 µm||200 µm|
|Force Constant||0.32 N/m||0.08 N/m|
|Resonance Frequency||67 kHz||17 kHz|
|Order Code||Quantity||Data Sheet|