Optimized positioning through maximized tip visibility
NanoWorld Arrow™ ultra high frequency AFM probes are capable of resonating with a very high frequency of up to 2.0 MHz. This probe type combines outstanding sensitivity with fast scanning ability. All probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a cantilever with a triangular free end and a tetrahedral tip with a height of 3 µm.
Additionally this AFM probe offers a typical tip radius of curvature of less than 10 nm.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
If needed, specific cantilever thicknesses can be selected within very narrow tolerances for an additional selection fee.
The reflex coating on the detector side of the cantilever enhances the reflectance and prevents light from interfering within the cantilever.
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 0.7 µm | 0.5 - 0.9 |
Cantilever Geometry
|
W = 42 µm L = 35 µm | - - |
| Force Constant | - | - |
| Resonance Frequency | 2 MHz | 0.7 - 2.0 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| ARROW-UHF-Sample | 2 | Nominal values |
| ARROW-UHF-10 | 10 | Nominal values |
| ARROW-UHF-20 | 20 | Nominal values |
| *Typical values | ||
