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NanoWorld AFM Probes
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Home  ›  Probes Catalog  ›  Arrow™  ›  Contact Mode AFM Probes  ›  Arrow™ CONT

Type: Arrow™ CONT

Contact Mode

Cantilever Data ValueRange*
Resonance Frequency 14 kHz10 - 19
Force Constant 0.2 N/m0.06 - 0.38
Length 450 µm445 - 455
Mean Width 45 µm40 - 50
Thickness 2.0 µm1.5 - 2.5

Product Description

Optimized positioning through maximized tip visibility

NanoWorld Arrow™ CONT probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm.

Additionally, this probe offers a tip radius of curvature of less than 10 nm.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Order Codes and Packages Sizes

 Order Code Quantity Data Sheet
ARROW-CONT-10 10 Nominal values
ARROW-CONT-20 20 Nominal values
ARROW-CONT-50 50 Nominal values
ARROW-CONT-W 380 Nominal values

Product Screencast

Product Screencast on NanoWorld Arrow™ Silicon AFM Probes
given by Manfred Detterbeck - CEO NanoWorld AG

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For more information contact: info@nanoworld.com
Arrow™ is a trademark of NanoWorld AG.
All data are subject to change without notice.
NanoWorld AG
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CH-2002 Neuchâtel
Switzerland
www.nanoworld.com
 
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