NanoWorld AFM Probes Brochure: english deutsch français español português рyccĸий 日本語 한국어 简体中文 繁體中文
NanoWorld AFM Probes
ArrowTM AFM Probes General Description
 Advanced Search
Home › Arrow™ ›  General Description


  • SPM and AFM probes for high resolution imaging
  • fit to all well-known commercial SPMs and AFMs
  • cantilever and tip are supported by a single crystal silicon support chip
  • monolithic design of support chip, cantilever and tip

Material Features

  • highly doped, single crystal silicon (resistivity 0.01 - 0.025 Ohm•cm)
  • no intrinsic stress and absolutely straight cantilevers
  • chemically inert silicon for application in fluids or electrochemical cells


  • rectangular cantilever with triangular free end
  • easy positioning of tip on the area of interest due to the Arrow™ shape
  • consistent distance between tip and cantilever end
  • trapezoidal cross section with wide detector side for easy laser adjustment

Support Chip

  • dimensions of the support chip are very reproducible (3.4 mm x 1.6 mm x 0.3 mm)
  • etched corners of the support chip avoid contact between the support chip and the sample


  • tip has a tetrahedral shape and is located at the very end of the cantilever
  • tip height 10-15 µm and radius of curvature typically < 10 nm (< 15 nm guaranteed)
  • macroscopic half cone angles
      - are 30° to 35° seen along the cantilever axis
      - are 20° to 25° seen from the side
For detailed information about our AFM probe product series please see below:
Member of NanoWorld Group