Optimized positioning through maximized tip visibility
NanoWorld Arrow™ FM probes are designed for Force Modulation Mode imaging. The Force Constant of the FM type fills the gap between Contact and Non-Contact probes. Furthermore Non-Contact / TappingMode™ imaging is possible with this AFM probe.
All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a height of 10 - 15 µm.
Additionally this probe offers a typical tip radius of curvature of less than 10 nm.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 3.0 µm | 2.5 - 3.5 |
Cantilever Geometry
|
W = 35 µm L = 240 µm | 30 - 40 235 - 245 |
| Force Constant | 2.8 N/m | 1.4 - 5.8 |
| Resonance Frequency | 75 kHz | 58 - 97 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| ARROW-FM-Sample | 2 | Nominal values |
| ARROW-FM-10 | 10 | Nominal values |
| ARROW-FM-20 | 20 | Nominal values |
| ARROW-FM-50 | 50 | Nominal values |
| ARROW-FM-W | 380 | Nominal values |
| *Typical values | ||
