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NanoWorld AFM Probes
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Home  ›  Probes Catalog  ›  Pointprobe®  ›  Force Modulation Microscopy (FM) AFM Probes  ›  FM

Type: FM

Force Modulation Mode

point probe afm tip
Cantilever Data ValueRange*
Resonance Frequency 75 kHz60 - 90
Force Constant 2.8 N/m1.2 - 5.5
Length 225 µm220 - 230
Mean Width 28 µm22.5 - 32.5
Thickness 3.0 µm2.5 - 3.5

Product Description

NanoWorld Pointprobe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping mode imaging is possible with this AFM probe.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.

Additionally this probe offers typical tip radius of curvature of less than 8 nm.

A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Order Codes and Packages Sizes

 Order Code Quantity Data Sheet
FM-10 10 yes
FM-20 20 yes
FM-50 50 no
FM-W 380 yes

Product Screencast

Product Screencast on NanoWorld Pointprobe® Silicon AFM Probes (Standard Tip)
given by Dr. Marco Becker - Product Developer

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For more information contact: info@nanoworld.com
Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.
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