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NanoWorld AFM Probes
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Home  ›  Probes Catalog  ›  Pointprobe®  ›  Force Modulation Microscopy (FM) AFM Probes  ›  FM

Type: FM

Force Modulation Mode

NanoWorld Pointprobe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping mode imaging is possible with this AFM probe.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.

Additionally this probe offers typical tip radius of curvature of less than 8 nm.

 
point probe afm tip
Cantilever Data ValueRange*
Thickness 3.0 µm2.5 - 3.5
Mean Width 28 µm22.5 - 32.5
Length 225 µm220 - 230
Force Constant 2.8 N/m1.2 - 5.5
Resonance Frequency 75 kHz60 - 90
 Order Code Quantity Data Sheet
*Typical values


For more information contact: info@nanoworld.com
Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.
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