NanoWorld Pointprobe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping mode imaging is possible with this AFM probe.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
Additionally this probe offers typical tip radius of curvature of less than 8 nm.
|Thickness||3.0 µm||2.5 - 3.5|
|Mean Width||28 µm||22.5 - 32.5|
|Length||225 µm||220 - 230|
|Force Constant||2.8 N/m||1.2 - 5.5|
|Resonance Frequency||75 kHz||60 - 90|
|Order Code||Quantity||Data Sheet|
|*Typical values Guaranteed values|
Product Screencast on
NanoWorld Pointprobe® Silicon AFM Probes (Standard Tip)
given by Dr. Marco Becker - Product Developer
Subscribe to NanoWorld Youtube Channel