NanoWorld Pointprobe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping mode imaging is possible with this AFM probe.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
Additionally this probe offers typical tip radius of curvature of less than 8 nm.
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 3.0 µm | 2.5 - 3.5 |
| Mean Width | 28 µm | 22.5 - 32.5 |
| Length | 225 µm | 220 - 230 |
| Force Constant | 2.8 N/m | 1.2 - 5.5 |
| Resonance Frequency | 75 kHz | 60 - 90 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| FM-10 | 10 | yes |
| FM-20 | 20 | yes |
| FM-50 | 50 | no |
| FM-W | 380 | yes |
| *Typical values | ||
