NanoWorld Pointprobe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping mode imaging is possible with this AFM probe.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
Additionally this probe offers typical tip radius of curvature of less than 8 nm.