NanoWorld Pointprobe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping mode imaging is possible with this AFM probe. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
For applications that require hard contact between tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.
The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.
The CDT features a conductive diamond coating. Some typical applications for this tip are Scanning Spreading Resistance Microscopy (SSRM), Tunneling AFM (Conducting AFM) and Scanning Capacitance Microscopy (SCM).
The reflex coating on the detector side of the cantilever enhances its reflectance and prevents light from interfering within the cantilever.
|Thickness||3.0 µm||2.5 - 3.5|
|Mean Width||27.5 µm||22.5 - 32.5|
|Length||225 µm||220 - 230|
|Force Constant||6.2 N/m||3 - 11.4|
|Resonance Frequency||105 kHz||80 - 130|
|Order Code||Quantity||Data Sheet|