Optimized positioning through maximized tip visibility
NanoWorld Arrow™ EFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of probe yields very high force sensitivity, while simultaneously enabling tapping and lift mode operation.
All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm.
Additionally, this probe offers a tip radius of curvature of less than 25 nm.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.