Optimized positioning through maximized tip visibility
NanoWorld Arrow™ EFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of probe yields very high force sensitivity, while simultaneously enabling tapping and lift mode operation.
All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a height of 10 - 15 µm.
Additionally this probe offers a typical tip radius of curvature of less than 10 nm.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
The platinum iridium5 (PtIr5) coating on both sides of the probe allows electrical contacts between tip and sample (high conductivity) while enhancing the reflectance of the cantilever. The typical tip radius of curvature is less than 25 nm.
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 3.0 µm | 2.5 - 3.5 |
Cantilever Geometry
|
W = 35 µm L = 240 µm | 30 - 40 235 - 245 |
| Force Constant | 2.8 N/m | 1.4 - 5.8 |
| Resonance Frequency | 75 kHz | 58 - 97 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| ARROW-EFM-10 | 10 | Nominal values |
| ARROW-EFM-20 | 20 | Nominal values |
| ARROW-EFM-50 | 50 | Nominal values |
| ARROW-EFM-W | 380 | Nominal values |
| *Typical values | ||
