NanoWorld Pointprobe® ZEILR probes are designed for owners of the Zeiss Veritekt or a Seiko Instruments microscope using the contact mode. Compared to the Pointprobe® contact mode probes of the CONT type the force constant is slightly increased.
The probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
Additionally this probe offers typical tip radius of curvature of less than 8 nm.
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 4.0 µm | 3.5 - 4.5 |
| Mean Width | 55 µm | 50 - 60 |
| Length | 450 µm | 445 - 455 |
| Force Constant | 1.6 N/m | 1.0 - 2.6 |
| Resonance Frequency | 27 kHz | 23 - 31 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| ZEILR-Sample | 2 | yes |
| ZEILR-10 | 10 | yes |
| ZEILR-20 | 20 | no |
| ZEILR-50 | 50 | yes |
| ZEILR-W | 380 | yes |
| *Typical values | ||
