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NanoWorld AFM Probes
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Home  ›  Probes Catalog  ›  Pointprobe®  ›  Contact Mode AFM Probes  ›  ZEILR

Type: ZEILR

ZEISS Veritekt microscopes - Contact mode
Low force constant - Reflex coating

point probe afm tip
Cantilever Data ValueRange*
Resonance Frequency 27 kHz23 - 31
Force Constant 1.6 N/m1.0 - 2.6
Length 450 µm445 - 455
Mean Width 55 µm50 - 60
Thickness 4.0 µm3.5 - 4.5

Product Description

NanoWorld Pointprobe® ZEILR probes are designed for owners of the Zeiss Veritekt or a Seiko Instruments microscope using the contact mode. Compared to the Pointprobe® contact mode probes of the CONT type the force constant is slightly increased.

The probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.

Additionally, this probe offers typical tip radius of curvature of less than 8 nm.

A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Coating Description

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

Order Codes and Packages Sizes

 Order Code Quantity Data Sheet
ZEILR-10 10 yes
ZEILR-20 20 yes
ZEILR-50 50 no
ZEILR-W 380 yes

Product Screencast

Product Screencast on NanoWorld Pointprobe® Silicon AFM Probes (Standard Tip)
given by Dr. Marco Becker - Product Developer

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For more information contact: info@nanoworld.com
Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.
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