NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
The platinum iridium5 (PtIr5) coating on both sides of the probe allows electrical contacts between tip and sample (high conductivity) while enhancing the reflectance of the cantilever. The typical tip radius of curvature is less than 25 nm.
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 4.0 µm | 3.5 - 4.5 |
| Mean Width | 30 µm | 25 - 35 |
| Length | 125 µm | 120 - 130 |
| Force Constant | 42 N/m | 21 - 78 |
| Resonance Frequency | 320 kHz | 250 - 390 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| NCHPt-10 | 10 | yes |
| NCHPt-20 | 20 | yes |
| NCHPt-50 | 50 | no |
| NCHPt-W | 380 | yes |
| *Typical values | ||
