NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
Additionally this probe offers typical tip radius of curvature of less than 8 nm.
The reflex coating on the detector side of the cantilever enhances its reflectance and prevents light from interfering within the cantilever.
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 2.0 µm | 1.5 - 2.5 |
| Mean Width | 50 µm | 45 - 55 |
| Length | 450 µm | 445 - 455 |
| Force Constant | 0.2 N/m | 0.07 - 0.4 |
| Resonance Frequency | 13 kHz | 9 - 17 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| CONTR-Sample | 2 | yes |
| CONTR-10 | 10 | yes |
| CONTR-20 | 20 | no |
| CONTR-50 | 50 | yes |
| CONTR-W | 380 | yes |
| *Typical values | ||
