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NanoWorld AFM Probes
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Contact Mode - Reflex coating

point probe afm tip
Cantilever Data ValueRange*
Resonance Frequency 13 kHz9 - 17
Force Constant 0.2 N/m0.07 - 0.4
Length 450 µm445 - 455
Mean Width 50 µm45 - 55
Thickness 2.0 µm1.5 - 2.5

Product Description

NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

Additionally, this probe offers typical tip radius of curvature of less than 8 nm.

A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Coating Description

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.

Order Codes and Packages Sizes

 Order Code Quantity Data Sheet
CONTR-10 10 yes
CONTR-20 20 yes
CONTR-50 50 no
CONTR-W 380 yes

Product Screencast

Product Screencast on NanoWorld Pointprobe® Silicon AFM Probes (Standard Tip)
given by Dr. Marco Becker - Product Developer

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For more information contact:
Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.
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