NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.
This probe offers unique features:
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 7.0 µm | 6.5 - 7.5 |
| Mean Width | 38 µm | 33 - 43 |
| Length | 225 µm | 220 - 230 |
| Force Constant | 48 N/m | 31 - 71 |
| Resonance Frequency | 190 kHz | 160 - 210 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| SSS-NCL-10 | 10 | yes |
| SSS-NCL-20 | 20 | yes |
| SSS-NCL-50 | 50 | no |
| SSS-NCL-W | 380 | yes |
| *Typical values | ||
