NanoWorld Pointprobe® CONTSCR AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
All SPM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
Additionally this probe offers typical tip radius of curvature of less than 8 nm.
The reflex coating on the detector side of the cantilever enhances its reflectance and prevents light from interfering within the cantilever.
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 1.0 µm | 0.5 - 1.5 |
| Mean Width | 48 µm | 42.5 - 52.5 |
| Length | 225 µm | 220 - 230 |
| Force Constant | 0.2 N/m | 0.02 - 0.7 |
| Resonance Frequency | 23 kHz | 10 - 39 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| CONTSCR-10 | 10 | yes |
| CONTSCR-20 | 20 | yes |
| CONTSCR-50 | 50 | no |
| CONTSCR-W | 380 | yes |
| *Typical values | ||
