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NanoWorld AFM Probes
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Contact Mode – Short Cantilever - Reflex coating

point probe afm tip
Cantilever Data ValueRange*
Resonance Frequency 25 kHz10 - 39
Force Constant 0.2 N/m0.02 - 0.7
Length 225 µm220 - 230
Mean Width 48 µm42.5 - 52.5
Thickness 1.0 µm0.5 - 1.5

Product Description

NanoWorld Pointprobe® CONTSCR AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

All SPM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

Additionally, this probe offers typical tip radius of curvature of less than 8 nm.

A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Coating Description

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.

Order Codes and Packages Sizes

 Order Code Quantity Data Sheet
CONTSCR-10 10 yes
CONTSCR-20 20 yes
CONTSCR-50 50 no
CONTSCR-W 380 yes

Product Screencast

Product Screencast on NanoWorld Pointprobe® Silicon AFM Probes (Standard Tip)
given by Dr. Marco Becker - Product Developer

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For more information contact:
Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.
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