NanoWorld AFM Probes Brochure: english deutsch français español português рyccĸий 日本語 한국어 简体中文 繁體中文
NanoWorld AFM Probes
Home  ›  Probes Catalog  ›  Pointprobe®  ›  Contact Mode AFM Probes  ›  CONTSC


Contact Mode – Short Cantilever

point probe afm tip
Cantilever Data ValueRange*
Resonance Frequency 25 kHz10 - 39
Force Constant 0.2 N/m0.02 - 0.7
Length 225 µm220 - 230
Mean Width 48 µm42.5 - 52.5
Thickness 1.0 µm0.5 - 1.5

Product Description

NanoWorld Pointprobe® CONTSC AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

Additionally, this probes offers typical tip radius of curvature of less than 8 nm.

A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Order Codes and Packages Sizes

 Order Code Quantity Data Sheet
CONTSC-10 10 yes
CONTSC-20 20 yes
CONTSC-50 50 no
CONTSC-W 380 yes

Product Screencast

Product Screencast on NanoWorld Pointprobe® Silicon AFM Probes (Standard Tip)
given by Dr. Marco Becker - Product Developer

Subscribe to NanoWorld Youtube Channel

For more information contact:
Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.
NanoWorld AG
Rue Jaquet-Droz 1
Case Postale 216
CH-2002 Neuchâtel
Member of NanoWorld Group