NanoWorld AFM Probes Brochure: english deutsch français español português рyccĸий 日本語 한국어 简体中文 繁體中文
NanoWorld AFM Probes
Home  ›  Probes Catalog  ›  Pointprobe®  ›  Non-Contact / Tapping Mode AFM Probes  ›  NCH

Type: NCH

Non-contact / Tapping™ mode - High resonance frequency

point probe afm tip
Cantilever Data ValueRange*
Resonance Frequency 320 kHz250 - 390
Force Constant 42 N/m21 - 78
Length 125 µm120 - 130
Mean Width 30 µm25 - 35
Thickness 4.0 µm3.5 - 4.5

Product Description

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

Additionally, this probe offers typical tip radius of curvature of less than 8 nm.

A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Order Codes and Packages Sizes

 Order Code Quantity Data Sheet
NCH-10 10 yes
NCH-20 20 yes
NCH-50 50 no
NCH-W 380 yes

Product Screencast

Product Screencast on NanoWorld Pointprobe® Silicon AFM Probes (Standard Tip) given by Dr. Marco Becker - Product Developer

Subscribe to NanoWorld Youtube Channel

For more information contact:
Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.
NanoWorld AG
Rue Jaquet-Droz 1
Case Postale 216
CH-2002 Neuchâtel
Member of NanoWorld Group