NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.
This probe offers unique features:
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 4.0 µm | 3.5 - 4.5 |
| Mean Width | 30 µm | 25 - 35 |
| Length | 125 µm | 120 - 130 |
| Force Constant | 42 N/m | 21 - 78 |
| Resonance Frequency | 320 kHz | 250 - 390 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| SSS-NCH-10 | 10 | yes |
| SSS-NCH-20 | 20 | yes |
| SSS-NCH-50 | 50 | no |
| SSS-NCH-W | 380 | yes |
| *Typical values | ||
