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NanoWorld AFM Probes
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Type: SSS-NCH

SuperSharpSilicon - Non-contact / Tapping™ mode -
High resonance frequency

Pointprobe afm probe 3
Cantilever Data ValueRange*
Resonance Frequency 320 kHz250 - 390
Force Constant 42 N/m21 - 78
Length 125 µm120 - 130
Mean Width 30 µm25 - 35
Thickness 4.0 µm3.5 - 4.5

Product Description

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

This probe offers unique features:

  • Typical tip radius of curvature of 2 nm
  • Guaranteed tip radius of curvature 5 nm (yield >80%)
  • Half cone angle < 10° at the last 200 nm of the tip


A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Order Codes and Packages Sizes

 Order Code Quantity Data Sheet
SSS-NCH-10 10 yes
SSS-NCH-20 20 yes
SSS-NCH-50 50 no
SSS-NCH-W 380 yes

Product Screencast

Product Screencast on NanoWorld Pointprobe® SuperSharpSilicon™ Tip (SSS)
given by Dr. Marco Becker - Product Developer

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For more information contact: info@nanoworld.com
Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.
NanoWorld AG
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CH-2002 Neuchâtel
Switzerland
www.nanoworld.com
 
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