NanoWorld Pointprobe® NCST AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. Thus, tip and sample wear could be significantly decreased.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
Additionally this AFM probe offers a typical tip radius of curvature of less than 8 nm.
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 2.8 µm | 2.3 - 3.3 |
| Mean Width | 27 µm | 22 - 32 |
| Length | 150 µm | 145 - 155 |
| Force Constant | 7.4 N/m | 3 - 16 |
| Resonance Frequency | 160 kHz | 120 - 205 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| NCST-Sample | 2 | yes |
| NCST-10 | 10 | yes |
| NCST-20 | 20 | no |
| NCST-50 | 50 | yes |
| NCST-W | 380 | yes |
| *Typical values | ||
