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NanoWorld AFM Probes
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Home  ›  Probes Catalog  ›  Pointprobe®  ›  Non-Contact / Tapping Mode AFM Probes  ›  NCST

Type: NCST

Non-contact / Soft Tapping mode

point probe afm tip
Cantilever Data ValueRange*
Resonance Frequency 160 kHz120 - 205
Force Constant 7.4 N/m3 - 16
Length 150 µm145 - 155
Mean Width 27 µm22 - 32
Thickness 2.8 µm2.3 - 3.3

Product Description

NanoWorld Pointprobe® NCST AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. Thus, tip and sample wear could be significantly decreased.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

Additionally, this AFM probe offers a typical tip radius of curvature of less than 8 nm.

A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Order Codes and Packages Sizes

 Order Code Quantity Data Sheet
NCST-10 10 yes
NCST-20 20 yes
NCST-50 50 no
NCST-W 380 yes

Product Screencast

Product Screencast on NanoWorld Pointprobe® Silicon AFM Probes (Standard Tip)
given by Dr. Marco Becker - Product Developer

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For more information contact: info@nanoworld.com
Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.
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