NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.
These probes offer unique features:
The reflex coating on the detector side of the cantilever enhances its reflectance and prevents light from interfering within the cantilever.
|Thickness||4.0 µm||3.5 - 4.5|
|Mean Width||30 µm||25 - 35|
|Length||125 µm||120 - 130|
|Force Constant||42 N/m||21 - 78|
|Resonance Frequency||320 kHz||250 - 390|
|Order Code||Quantity||Data Sheet|