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NanoWorld AFM Probes
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Type: SSS-SEIH

SuperSharpSilicon - SEIKO INSTRUMENTS microscopes -
Non-contact mode - High force constant

Pointprobe afm probe 3
Cantilever Data ValueRange*
Resonance Frequency 130 kHz110 - 150
Force Constant 15 N/m9 - 25
Length 225 µm220 - 230
Mean Width 33 µm27.5 - 37.5
Thickness 5.0 µm4.5 - 5.5

Product Description

NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode. All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

This probe offers unique features:

  • Typical tip radius of curvature of 2 nm
  • Guaranteed tip radius of curvature 5 nm (yield >80%)
  • Half cone angle < 10° at the last 200 nm of the tip


A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Order Codes and Packages Sizes

 Order Code Quantity Data Sheet
SSS-SEIH-10 10 yes
SSS-SEIH-20 20 yes
SSS-SEIH-50 50 no
SSS-SEIH-W 380 yes

Product Screencast

Product Screencast on NanoWorld Pointprobe® SuperSharpSilicon™ Tip (SSS)
given by Dr. Marco Becker - Product Developer

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For more information contact: info@nanoworld.com
Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.
NanoWorld AG
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CH-2002 Neuchâtel
Switzerland
www.nanoworld.com
 
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