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NanoWorld AFM Probes
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Type: MFMR

Magnetic force microscopy - Reflex coating

Cantilever Data ValueRange*
Resonance Frequency 75 kHz60 - 90
Force Constant 2.8 N/m1.2 - 5.5
Length 225 µm220 - 230
Mean Width 28 µm22.5 - 32.5
Thickness 3.0 µm2.5 - 3.5

Product Description

NanoWorld Pointprobe® MFM probes are designed for magnetic force microscopy. The force constant and the special hard magnetic tip-side coating of the MFM type are optimised for this type of application. This type of probe yields a very high force sensitivity, while simultaneously enabling tapping and lift mode operation.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

Additionally, this probe offers unique features:

  • typical tip radius of curvature < 50 nm
  • high magnetic contrast and lateral resolution < 100 nm
  • electrically conductive coating
Soft magnetic samples may be influenced by the tip magnetization!

A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Coating Description

Hard Magnetic Coating / Aluminum Reflex Coating

The hard magnetic coating consists of a 40 nm thick cobalt alloy layer deposited on the tip side of the cantilever which leads to a permanent magnetization of the tip with the direction usually along the tip axis. We recommend magnetizing the tip by means of a strong magnet (e.g. a NdFeB magnet, a few millimeters in size) prior to the measurement.

The aluminum reflex coating deposited on the detector side of the cantilever enhances the reflectance of the laser beam and prevents light from interfering within the cantilever.

As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.

Order Codes and Packages Sizes

 Order Code Quantity Data Sheet
MFMR-10 10 yes
MFMR-20 20 yes
MFMR-50 50 no
MFMR-W 380 yes

Product Screencast

Product Screencast on NanoWorld Magnetic Force Microscopy (MFM) AFM Probes
given by Dr. Marco Becker - Product Developer

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For more information contact:
Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.
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