NanoWorld Pointprobe® EFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of probe yields a very high force sensitivity, while simultaneously enabling tapping and lift mode operation.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
The platinum iridium5 (PtIr5) coating on both sides of the probe allows electrical contacts between tip and sample (high conductivity) while enhancing the reflectance of the cantilever. The typical tip radius of curvature is less than 25 nm.
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 3.0 µm | 2.5 - 3.5 |
| Mean Width | 28 µm | 22.5 - 32.5 |
| Length | 225 µm | 220 - 230 |
| Force Constant | 2.8 N/m | 1.2 - 5.5 |
| Resonance Frequency | 75 kHz | 60 - 90 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| EFM-10 | 10 | yes |
| EFM-20 | 20 | yes |
| EFM -50 | 50 | no |
| EFM -W | 380 | yes |
| *Typical values | ||
