Conductive Diamond Coated AFM Tip, silicon AFM cantilever for Force Modulation Mode
tip side: conductive diamond coating
back side: reflex coating
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CDT-FMR R
[C = 6.2 N/m; fo = 105 kHz]
Arrow™ EFM P
[C = 2.8 N/m; fo = 75 kHz]
Conductive Arrow™ Silicon AFM Probe, silicon AFM cantilever for Electrostatic Force Microscopy
back and tip side:
platinum iridium5 (PtIr5) coating
EFM P
[C = 2.8 N/m; fo = 75 kHz]
Conductive Pointprobe® Silicon AFM Probe for Electrostatic Force Microscopy
back and tip side:
platinum iridium5 (PtIr5) coating
CDT-NCHR R
[C = 80 N/m; fo = 400 kHz]
Conductive Diamond Coated AFM Tip, silicon AFM cantilever for Non-Contact / Tapping Mode
tip side: conductive diamond coating
back side: reflex coating
CDT-NCLR R
[C = 72 N/m; fo = 210 kHz]
(long AFM cantilever 225 µm)
Conductive Diamond Coated AFM Tip, silicon AFM cantilever for Non-Contact / Tapping Mode
tip side: conductive diamond coating
back side: reflex coating
NCHPt P
[C = 42 N/m; fo = 320 kHz]
Conductive Pointprobe® Silicon AFM Probe, silicon AFM cantilever for Non-Contact / Tapping Mode
back and tip side:
platinum iridium5 (PtIr5) coating
Arrow™ NCPt P
[C = 42 N/m; fo = 285 kHz]
Conductive Arrow™ Silicon AFM Probe, silicon AFM cantilever for Non-Contact / Tapping Mode
back and tip side:
platinum iridium5 (PtIr5) coating
NCLPt P
[C = 48 N/m; fo = 190 kHz]
(long AFM cantilever 225 µm)
Conductive Pointprobe® Silicon AFM Probe, silicon AFM cantilever for Non-Contact / Tapping Mode
back and tip side:
platinum iridium5 (PtIr5) coating
Arrow™ CONTPt P
[C = 0.2 N/m; fo = 14 kHz]
Conductive Arrow™ Silicon AFM Probe, silicon AFM cantilever for Contact Mode
back and tip side:
platinum iridium5 (PtIr5) coating
CONTPt P
[C = 0.2 N/m; fo = 13 kHz]
Conductive Pointprobe® Silicon AFM Probe, silicon AFM cantilever for Contact Mode
back and tip side:
platinum iridium5 (PtIr5) coating
For detailed information about our AFM probe product series please see below: