SuperSharpSilicon™ AFM Probes for High Resolution

SuperSharpSilicon™:

Back side coating for higher laser reflectance: RReflex (aluminum) GGold PPtlr5
  • SSS-NCH

    SSS-NCH

    [C = 42 N/m; fo = 320 kHz]

    SuperSharpSilicon™ AFM Probe, silicon AFM cantilever for Non-Contact / Tapping Mode with SuperSharpSilicon™ Tip
    based on Pointprobe® technology

  • SSS-SEIH

    SSS-SEIH

    [C = 15 N/m; fo = 130 kHz]

    (for SEIKO AFMs)
    SuperSharpSilicon™ AFM Probe silicon AFM cantilever for Non-Contact / Tapping Mode with SuperSharpSilicon™ Tip
    based on Pointprobe® technology

  • SSS-NCL

    SSS-NCL

    [C = 48 N/m; fo = 190 kHz]

    (long AFM cantilever 225 µm)
    SuperSharpSilicon™ AFM Probe silicon AFM cantilever for Non-Contact / Tapping Mode with SuperSharpSilicon™ Tip
    based on Pointprobe® technology

Back side coating for higher laser reflectance: RReflex (aluminum) GGold PPtlr5

For detailed information about our AFM probe product series please see below:

POINTPROBE® POINTPROBE®
ARROW™™ ARROW™
ULTRA-SHORT CANTILEVERS ULTRA-SHORT CANTILEVERS
PYREX-NITRIDE PYREX-NITRIDE
COATINGS COATINGS
Videos Brochure Downloads How to optimize AFM scan parameters