Ultra-Short Cantilevers Series - General Description - AFM Tips - NanoWorld


  • especially designed for high speed scanning applications
  • cannot be used in all commercial SPMs and AFMs due to the small dimensions of the AFM cantilevers
  • AFM cantilever and AFM tip are supported by a single crystal silicon support chip
  • no intrinsic stress and absolutely straight AFM cantilevers

AFM Cantilever

  • rectangular AFM cantilever with rounded corners at the freestanding end
  • AFM cantilever made of quartz-like material

Support Chip

  • dimensions of the silicon support chip are very reproducible (3.4 mm x 1.6 mm x 0.3 mm)
  • etched and lowered corners of the support chip avoid contact between the support chip and the sample
  • alignment grooves on the back side of the silicon support chip in conjunction with the alignment chip ensure replacement of the AFM probes without major readjustment of the laser beam


  • nanotools® High Density Carbon/Diamond Like Carbon (HDC/DLC) tip
  • AFM tip height typically 2.5 μm and radius of curvature typically < 10 nm  
  • AFM tip aspect ratio typically 5:1 and tilt compensation of 8°

For detailed information about our AFM probe product series please see below: