Ultra-Short Cantilevers Series - General Description - AFM Tips - NanoWorld
General
- especially designed for high speed scanning applications
- cannot be used in all commercial SPMs and AFMs due to the small dimensions of the cantilevers
- cantilever and tip are supported by a single crystal silicon support chip
- no intrinsic stress and absolutely straight cantilevers
Cantilever
- rectangular cantilever with rounded corners at the freestanding end
- cantilever made of quartz-like material
Support Chip
- dimensions of the silicon support chip are very reproducible (3.4 mm x 1.6 mm x 0.3 mm)
- etched and lowered corners of the support chip avoid contact between the support chip and the sample
- alignment grooves on the back side of the silicon support chip in conjunction with the alignment chip ensure replacement of the probes without major readjustment of the laser beam
Tip
- nanotools® High Density Carbon/Diamond Like Carbon (HDC/DLC) tip
- tip height typically 2.5 μm and radius of curvature typically < 10 nm
- tip aspect ratio typically 5:1 and tilt compensation of 8°
For detailed information about our AFM probe product series please see below: