The Direct Replacement for the discontinued ASYELEC.01 Conductive AFM Probe

The NanoWorld® Arrow™ FM Iridium™ is a silicon-based beam deflection AFM probe with a Iridium coating on both Tip and detector side, specifically developed for nano-electrical measurements and designed as the direct one-to-one replacement for the discontinued ASYELEC.01 conductive AFM probe from Asylum Research, an Oxford Instruments company.

Built on NanoWorld's proven Arrow™ FM platform, Arrow™ FM Iridium continues the well-established probe geometry trusted by researchers worldwide for nano-electrical AFM applications. Combined with a durable iridium coating on both the AFM tip and detector side of the cantilever, it delivers outstanding electrical conductivity, excellent tip sharpness, long probe lifetime and the exceptional manufacturing quality for which NanoWorld® AFM probes are known.

Arrow™ FM Iridium is optimized for a broad range of nano-electrical AFM techniques including Conductive Atomic Force Microscopy (c-AFM), Electric Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), Scanning Spreading Resistance Microscopy (SSRM) and other electrical scanning probe microscopy applications requiring high electrical conductivity together with excellent spatial resolution.

Typical applications include:

• Conductive AFM (c-AFM)
• Electric Force Microscopy (EFM)
• Kelvin Probe Force Microscopy (KPFM / SKPFM)
• Scanning Capacitance Microscopy (SCM)
• Scanning Spreading Resistance Microscopy (SSRM)
• Semiconductor device characterization
• Electrical characterization of 2D materials
• Ferroelectric materials
• Battery and energy materials
• Nanoelectronics
• Electrical failure analysis

Key Benefits

• Direct one-to-one replacement for the discontinued ASYELEC.01 conductive AFM probe
• Preserves the proven Arrow™ FM cantilever geometry trusted by ASYELEC.01 users
• Continue using established imaging parameters and experimental workflows
• Built on NanoWorld's proven Arrow™ FM platform
• Durable iridium coating on both the AFM tip and detector side
• Excellent electrical conductivity
• Outstanding tip sharpness and long probe lifetime

The unique Arrow™ shape with the AFM tip position at the very end of the AFM cantilever allows easy positioning of the AFM tip on the area of interest.

A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Iridium Coating

The Arrow FM Iridium™ features a specially optimized iridium coating deposited on both the AFM tip side and the detector side of the cantilever. A very thin adhesion layer is applied to ensure excellent adhesion of the iridium coating without affecting the probe's electrical or mechanical performance. This coating has been specifically optimized for the Arrow FM Iridium™, the direct replacement for the discontinued ASYELEC.01 conductive AFM probe. The thin conductive Iridium coating preserves the sharp tetrahedral silicon tip geometry while providing excellent electrical conductivity and outstanding wear resistance. This unique combination enables high-resolution electrical and topographical measurements together with an exceptionally long probe lifetime. The detector side coating approximately doubles the reflectivity of the cantilever for the optical beam deflection system while minimizing optical interference within the cantilever, resulting in improved laser detection and signal stability. The coating process has been optimized for excellent adhesion, minimal intrinsic stress and high wear resistance. The nearly stress-free coating preserves the mechanical characteristics of the cantilever by minimizing coating-induced bending and ensuring reliable, reproducible performance throughout the lifetime of the probe.