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AFM Tips by Shape

4-sided Pyramidal AFM Tips

Standard Non-Rotated AFM Tips (Pointprobe® like)
PointProbe ® AFM Tip
PointProbe® AFM Tip

AFM tips with a polygon based pyramid shape positioned close to the free end of the AFM cantilever.

  • Macroscopic half-cone angle 20° to 25° viewed along the cantilever axis, 25° to 30° viewed from the side
  • Half-cone angle smaller than 10° at the apex
  • AFM tip height 10-15 µm
  • Front and back pyramid angles of the AFM tip with respect to the vertical differ when the probe is mounted onto the AFM head
» Browse all AFM probes with standard non-rotated AFM tips
AFM Tips with Square-Based Pyramid
Pyrex-Nitride AFM Tip
Pyrex-Nitride AFM Tip

AFM tips with a square AFM tip pyramid.

  • Oxide sharpened AFM tip
  • AFM tip height 3.5 µm
  • AFM tip radius of curvature below 10 nm
» Browse all AFM probes with square-based pyramid AFM tips
Spike AFM Tips
4-sided Sharpened Casted Pyramidal AFM Tips
Pyrex-Nitride AFM Tip
Pyrex-Nitride AFM Tip

AFM tips with a square-based pyramid.

  • Oxide sharpened AFM tip
  • AFM tip pyramid height 3.5 µm
  • AFM tip radius of curvature below 10 nm
» Browse all AFM probes with square pyramid AFM tips
3-sided Sharpened Pyramidal AFM Tips
3-sided Sharpened Pyramidal AFM Tip
3-sided Sharpened
Pyramidal AFM Tip

AFM tips with a 3-sided sharpened pyramid positioned close to the free end of the AFM cantilever.

» Browse all AFM probes with 3-sided sharpened pyramidal AFM tips
3-sided Super Sharpened Pyramidal AFM Tips
SuperSharpSilicon™ AFM Tip
SuperSharpSilicon™ AFM Tip

AFM tips with a SuperSharpSilicon apex for high resolution AFM imaging of nanostructures and microroughness.

  • Guaranteed AFM tip radius of curvature below 5 nm
  • Typical AFM tip radius of curvature 2 nm
  • Typical aspect ratio of the last 200 nm 4:1
  • Half cone angle 200 nm from the AFM tip apex below 10°
» Browse all AFM probes with super sharpened pyramidal AFM tips
Focused Ion Beam AFM Tips
High Aspect Ratio AFM Tip
High Aspect Ratio AFM Tip

AFM tips with a high aspect ratio portion allowing measurements of deep trenches.

  • High aspect portion of the AFM tip larger than 2 µm and symmetric when viewed from side as well as along cantilever axis
  • Typical aspect ratio for the last 2 µm of the AFM tip in the order of 7:1 to 12:1
  • Half cone angle of the high aspect ratio portion of the AFM tip typically from 5° down to below 2.8°
» Browse all AFM probes with focused ion beam AFM tips
Tilt Compensated Focused Ion Beam AFM Tips

AFM tips with a high aspect ration portion allowing measurements of deep trenches. The tilted high aspect ratio portion compensates the mounting angle within the AFM head. (for AFM instruments with a mounting angle of 13°)

  • Tilted high aspect ratio tip compensates the mounting angle of AFM head
  • Sidewall angles and sidewalls are „not“ distorted
Regular High Aspect Ratio AFM Tip
Regular High Aspect Ratio 
AFM Tip
Tilt Compensated High Aspect Ratio AFM Tip
Tilt Compensated 
High Aspect Ratio AFM Tip
Tilt Compensated High Aspect Ratio AFM Tip
Tilt Compensated 
High Aspect Ratio AFM Tip

» Browse all AFM probes with tilt compensated high aspect ratio AFM tips

 
 
Electron Beam Deposited AFM Tips
EBD AFM Tip
EBD AFM Tip

AFM tips with Electron Beam Deposited (EBD) extratips.

  • Extratips with various geometry on the apex of the silicon AFM tip for different applications
  • Sharp EBD AFM tips for high resolution imaging and high aspect ratio EBD AFM tips for deep trench measurements
» Browse all AFM probes with EBD AFM tips

AFM Tips by Material

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Silicon AFM Tips
Silicon AFM Tip
Silicon AFM Tip

AFM tips made of single crystal silicon.

  • All components of the AFM probe: the AFM tip, the AFM cantilever and the AFM support chip are made of monolithic single crystal silicon
  • Silicon is highly doped for static charge dissipation
» Browse all AFM probes with silicon AFM tips
Silicon Nitride AFM Tips
sSilicon Nitride AFM Tip
Silicon Nitride AFM Tip

AFM tips made of silicon nitride.

  • The AFM tip and the AFM cantilever are made of silicon nitride
  • The AFM cantilever is attached to a silicon or a borosilicate glass support chip
» Browse all AFM probes with silicon nitride AFM tips
High Density Carbon AFM Tips (Electron Beam Deposited)
High Density Carbon (HDC) AFM Tip
High Density Carbon (HDC)
AFM Tip

EBD High Density Carbon (HDC) AFM tips.

» Browse all AFM probes with high density carbon AFM tips

AFM Tips by Coating

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Uncoated AFM Tips
Uncoated AFM Tip
Uncoated AFM Tip

AFM tips without coating.

  • No coating on the tip side of the cantilever either
  • General purpose AFM tips
» Browse all AFM probes with uncoated AFM tips
Platinum/Iridium Coated AFM Tips
Platinum/Iridium Coated AFM Tip
Platinum/Iridium Coated
AFM Tip

AFM tips with a platinum/iridium coating.

  • Platinium/Iridium coating covers the entire cantilever as well
  • Electrically conductive
  • Used for electric mode AFM measurements
» Browse all AFM probes with platinum/iridium coated AFM tips
Diamond Coated AFM Tips
Diamond Coated AFM Tip
Diamond Coated AFM Tip

AFM tips with a real diamond coating for unsurpassed wear resistance.

  • Diamond coating covers the tip side of the cantilever as well
  • Ensures an even higher durability than DLC coating
» Browse all AFM probes with real diamond coated AFM tips
Conductive Diamond Coated AFM Tips
Conductive Diamond Coated AFM Tip
Conductive Diamond
Coated AFM Tip

AFM tips with a doped diamond coating.

  • Conductive Diamond coating covers the tip side of the cantilever as well
  • Provides high wear resistance for electric mode applications
» Browse all AFM probes with conductive diamond coated AFM tips
Cobalt Alloy Coated AFM Tips
Cobalt Alloy Coated AFM Tip
Cobalt Alloy Coated
AFM Tip

AFM tips with a cobalt alloy magnetic coating for Magnetic Force Microscopy (MFM) measurements.

  • Cobalt Alloy coating covers the tip side of the cantilever as well
  • Several different variations with different magnetic momentum and coercivity available
» Browse all AFM probes with magnetic AFM tips