SuperSharpSilicon™ AFM Probes (SSS) for High Resolution AFM Imaging
SSS-NCH [fo: 320 kHz, C: 42 N/m] SuperSharpSilicon™ AFM Probe silicon cantilever for Non-Contact / TappingMode with SuperSharpSilicon™ Tip based on Pointprobe® technology SSS-SEIH [fo: 130 kHz, C: 15 N/m] (for SEIKO AFMs) SuperSharpSilicon™ AFM Probe silicon cantilever for Non-Contact / TappingMode with SuperSharpSilicon™ Tip based on Pointprobe® technology SSS-NCL [fo: 190 kHz, C: 48 N/m] (long cantilever 225 µm) SuperSharpSilicon™ AFM Probe silicon cantilever for Non-Contact / TappingMode with SuperSharpSilicon™ Tip based on Pointprobe® technology     For detailed information about our AFM Probe product series please see below: ARROW     Pyrex-Nitride     Pointprobe®     Coatings
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