NanoWorld Arrow™ CONTPt AFM probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.

All AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The SPM probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a height of 10 - 15 µm.

Additionally this probe offers a typical tip radius of curvature of less than 10 nm.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

PtIr5 coating is an approximately 23 nm thick double layer of chromium and platinum iridium5 on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of 2 and prevents light from interfering within the cantilever. The coating process is optimised for stress compensation and wear resistance. The bending of the cantilever due to stress is less than 2°. Wear at the tip can occur if operating in contact-, friction- or force modulation mode.