Type: Arrow™ CONTPt

Contact Mode - PtIr5 coating

Logo
Cantilever Data Value Range*
Resonance Frequency 14 kHz 10 - 19 kHz
Force Constant 0.2 N/m 0.06 - 0.38 N/m
Length 450 µm 445 - 455 µm
Mean Width 45 µm 40 - 50 µm
Thickness 2 µm 1.5 - 2.5 µm
ARROW™ AFM tip

ARROW™ AFM tip More images

Product Description

Optimized positioning through maximized AFM tip visibility

NanoWorld® Arrow™ CONTPt AFM probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip with a typical height of 10 - 15 µm.

Additionally, this AFM probe offers an AFM tip radius of curvature of less than 25 nm.

The unique Arrow™ shape with the AFM tip position at the very end of the AFM cantilever allows easy positioning of the AFM tip on the area of interest.

Image A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Arrow

Coating: Electrically Conductive

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

Order Codes

Order Code Quantity Data Sheet
ARROW-CONTPt-10 10 Nominal values
ARROW-CONTPt-20 20 Nominal values
ARROW-CONTPt-50 50 Nominal values
ARROW-CONTPt-W 380 Nominal values

NanoWorld® Platinum / Iridium5 (PtIr5) Coated AFM Tips Screencast

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Bruker® is a trademark of Bruker Corporation

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com

For detailed information about our AFM probe product series please see below: