Type: Arrow™ CONT
Contact Mode

Optimized positioning through maximized tip visibility

NanoWorld Arrow™ CONT probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.

All probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a height of 10 - 15 µm.

Additionally this probe offers a typical tip radius of curvature of less than 10 nm.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

Technical Data Value Range*
Thickness 2.0 µm 1.5 - 2.5
Cantilever Geometry

W = 45 µm

L = 450 µm
40 - 50

445 - 455
Force Constant 0.2 N/m 0.06 - 0.38
Resonance Frequency 14 kHz 10 - 19
 
Order Code Quantity Data Sheet
Arrow CONT-10 10 Nominal values
Arrow CONT-20 20 Nominal values
Arrow CONT-50 50 Nominal values
Arrow CONT-W 380 Nominal values

* Typical values

For more information contact: info@nanoworld.com

Arrow™ is a trademark of NANOWORLD AG
TappingMode™ is a trademark of Digital Instruments Inc.
GelPak® is a registered trademark of Vichem Corporation
All data are subject to change without notice.
NanoWorld AG
Rue Jaquet-Droz 1
Case Postale 216
CH-2002 Neuchâtel
Switzerland
www.nanoworld.com

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