 |
|
 Type: SSS-SEIH |
|
SuperSharpSilicon - SEIKO INSTRUMENTS microscopes - Non-contact mode - High force constant |
|
|
NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode. All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10-15 µm.
For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip. This probe offers unique features: |
| Technical Data | Value | Range* |  |
| Thickness | 5 µm | 4.5 - 5.5 | |
| Mean Width | 33 µm | 27.5 - 37.5 | |
| Length | 225 µm | 220 - 230 | |
| Force Constant | 15 N/m | 9 - 25 | |
| Resonance Frequency | 130 kHz | 110 - 150 | |
| Order Code | Quantity | Data Sheet | |
| SSS-SEIH-10 | 10 | yes | |
| SSS-SEIH-20 | 20 | yes | |
| SSS-SEIH-50 | 50 | no | |
| SSS-SEIH-W | 380 | yes | |
* Typical values |
|||
|
For more information contact: info@nanoworld.com
| |
|
POINTPROBE® is a registered trademark of NANOWORLD AG TappingMode™ is a trademark of Digital Instruments Inc. GelPak® is a registered trademark of Vichem Corporation All data are subject to change without notice. |
NanoWorld AG Rue Jaquet-Droz 1 Case Postale 216 CH-2002 Neuchâtel Switzerland www.nanoworld.com |