Type: DT-NCHR

Diamond coated AFM tip - Non-contact / Tapping™ mode - High resonance frequency - Reflex coating

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Cantilever Data Value Range*
Resonance Frequency 400 kHz 280 - 510 kHz
Force Constant 80 N/m 42 - 142 N/m
Length 125 µm 120 - 130 µm
Mean Width 30 µm 25 - 35 µm
Thickness 4 µm 3.5 - 4.5 µm

This AFM probe has alignment grooves on the back side of the support chip.

diamond coated tip

diamond coated tip

Product Description

NanoWorld® Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

For applications that require hard contact between AFM tip and sample this AFM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.

The typical macroscopic AFM tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.

For applications requiring lower resonance frequencies or an AFM cantilever length exceeding 125 µm we recommend our Pointprobe® type DT-NCLR.

Image A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Standard

Coating: Diamond

Diamond Coating / Aluminum Reflex Coating

The diamond coating consists of a 100 nm thick polycrystalline diamond layer deposited on the tip side of the AFM cantilever resulting in an unsurpassed hardness of the AFM tip.

The aluminum reflex coating deposited on the detector side of the AFM cantilever enhances the reflectance of the laser beam and prevents light from interfering within the AFM cantilever.

Order Codes

Order Code Quantity Data Sheet
DT-NCHR-10 10 yes
DT-NCHR-20 20 yes
DT-NCHR-50 50 no

NanoWorld® Pointprobe® Diamond Coated AFM Tip (DT), Conductive Diamond Coated AFM Tip (CDT) Screencast

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Bruker® is a trademark of Bruker Corporation

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com

For detailed information about our AFM probe product series please see below: