Type: SSS-NCH
SuperSharpSilicon - Non-contact / Tapping™ mode -
High resonance frequency
NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 -15 µm.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

This probe offers unique features:

  • Typical tip radius of curvature of 2 nm
  • Guaranteed tip radius of curvature 5 nm (yield >80%)
  • Half cone angle < 10° at the last 200 nm of the tip

    • Technical Data Value Range*
    Thickness 4 µm 3.5 - 4.5
    Mean Width 30 µm 25 - 35
    Length 125 µm 120 - 130
    Force Constant 42 N/m 21 - 78
    Resonance Frequency 320 kHz 250 - 390
     
    Order Code Quantity Data Sheet
    SSS-NCH-10 10 yes
    SSS-NCH-20 20 yes
    SSS-NCH-50 50 no
    SSS-NCH-W 380 yes

    * Typical values

    For applications requiring lower resonance frequencies or a cantilever length exceeding 125 µm
    we recommend our Pointprobe® type SSS-NCL.

    For more information contact: info@nanoworld.com

    POINTPROBE® is a registered trademark of NANOWORLD AG
    TappingMode™ is a trademark of Digital Instruments Inc.
    GelPak® is a registered trademark of Vichem Corporation
    All data are subject to change without notice.     		NanoWorld AG
    Rue Jaquet-Droz 1
    Case Postale 216
    CH-2002 Neuchâtel
    Switzerland
    www.nanoworld.com

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