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 Type: ZEILR |
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ZEISS Veritekt microscopes - Contact mode Low force constant - Reflex coating |
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NanoWorld Pointprobe® ZEILR probes are designed for owners of the Zeiss Veritekt or a Seiko Instruments microscope using the contact mode. Compared to the Pointprobe® contact mode probes of the CONT type the force constant is slightly increased. The probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 -15 µm. Additionally this probe offers typical tip radius of curvature of less than 8 nm. |
| Technical Data | Value | Range* |  |
| Thickness | 4 µm | 3.5 - 4.5 | |
| Mean Width | 55 µm | 50 - 60 | |
| Length | 450 µm | 445 - 455 | |
| Force Constant | 1.6 N/m | 1.0 - 2.6 | |
| Resonance Frequency | 27 kHz | 23 - 31 | |
| Order Code | Quantity | Data Sheet | |
| ZEILR-10 | 10 | yes | |
| ZEILR-20 | 20 | yes | |
| ZEILR-50 | 50 | no | |
| ZEILR-W | 380 | yes | |
* Typical values |
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| Reflex Coating |
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| Reflex coating is an approximately 30 nm thick aluminium coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever. |
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For more information contact: info@nanoworld.com
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POINTPROBE® is a registered trademark of NANOWORLD AG TappingMode™ is a trademark of Digital Instruments Inc. GelPak® is a registered trademark of Vichem Corporation All data are subject to change without notice. |
NanoWorld AG Rue Jaquet-Droz 1 Case Postale 216 CH-2002 Neuchâtel Switzerland www.nanoworld.com |