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 Type: CONT |
| Contact Mode |
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NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant. All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10-15 µm. Additionally this probe offers typical tip radius of curvature of less than 8 nm. |
| Cantilever Data | Value | Range* |  |
| Thickness | 2 µm | 1.5 - 2.5 | |
| Mean Width | 50 µm | 45 - 55 | |
| Length | 450 µm | 445 - 455 | |
| Force Constant | 0.2 N/m | 0.07 - 0.4 | |
| Resonance Frequency | 13 kHz | 9 - 17 | |
| Order Code | Quantity | Data Sheet | |
| CONT-10 | 10 | yes | |
| CONT-20 | 20 | yes | |
| CONT-50 | 50 | no | |
| CONT-W | 385 | yes | |
* Typical values |
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For more information contact: info@nanoworld.com
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POINTPROBE® is a registered trademark of NANOWORLD AG TappingMode™ is a trademark of Digital Instruments Inc. GelPak® is a registered trademark of Vichem Corporation All data are subject to change without notice. |
NanoWorld AG Rue Jaquet-Droz 1 Case Postale 216 CH-2002 Neuchâtel Switzerland www.nanoworld.com |