NanoWorld provides silicon and silicon-nitride SPM-probes worldwide. (SPM=Scanning Probe Microscopy) After introducing the new Pyrex-Nitride series, we offer three product lines:
Pointprobe®
The AFM probes of the Pointprobe® series are the most widely used and best known AFM probes world-wide. The product series comprises scanning probes for the widest range of applications.
The Pointprobe® AFM probes are available with different coatings like Platinum-Iridium(PtIr5), Magnetic, Diamond or Gold coatings.
Additionally we offer special tip versions like our SuperSharpSilicon for high resolution imaging or High Aspect Ratio Tips that are often used for deep trench measurements.
Our Arrow™ series features standard AFM tips for contact, non-contact and force modulation mode that have a tetrahedral tip
The unique Arrow™ shape of the cantilever allows easy positioning of the tip on the area of interest.
Furthermore the Arrow™ series also includes a range of tipless cantilevers and cantilever arrays
Pyrex-Nitride
The Pyrex-Nitride Series combines silicon nitride cantilevers and tips with the proven glass chip concept. The Pyrex-Nitride series has been designed for a great variety of imaging techniques like in air and liquid. Three different types of Pyrex-Nitride Probes are currently available: SPM probes with rectangular cantilevers, SPM probes with triangular cantilevers and SPM probes with tipless triangular cantilevers.
Special SPM Probes can be designed and manufactured upon customers’ request.
![[1] Standard Pointprobe; [2] High Aspect Ratio Tip; [3] Arrow; [4] Pyrex-Nitride;](p/p20h1.jpg "[1] Standard Pointprobe; [2] High Aspect Ratio Tip; [3] Arrow; [4] Pyrex-Nitride;")
