Please click here to have a look at our Probes Catalog.
 NanoWorld provides silicon and silicon-nitride SPM and AFM probes worldwide. (SPM=Scanning Probe Microscopy, AFM = Atomic Force Microscopy) After introducing the new Pyrex-Nitride series, We currently offer three product lines: |
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The AFM probes of the Pointprobe series are the most widely used and best known AFM probes worldwide. The product series comprises scanning probes for the widest range of applications. The Pointprobe AFM probes are available with different coatings like Platinum-Iridium (PtIr5), Magnetic, Diamond or Gold. Additionally we offer special tip versions like our SuperSharpSilicon for high resolution imaging or High Aspect Ratio Tips for deep trench measurements. |
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Our Arrow™ series features standard AFM tips for contact, non-contact and force modulation mode that have a tetrahedral tip. |
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The Pyrex-Nitride series combines silicon nitride cantilevers and tips with the proven glass chip concept. The Pyrex-Nitride series has been designed for a great variety of imaging techniques like in air and liquid. Three different types of Pyrex-Nitride Probes are currently available: AFM probes with rectangular cantilevers, AFM probes with triangular cantilevers and AFM probes with tipless triangular cantilevers. |
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Special AFM Probes can be designed and manufactured upon customer's request. Please contact our development team at developers@nanoworld.com |
