• most widely used and best known SPM and AFM probe world-wide
• silicon SPM and AFM probe for very high resolution imaging
• alignment grooves on back side of support chip
• tip radius typically < 8 nm,
guaranteed <12 nm
• available with different tip shapes
• ultra-short cantilevers designed for High-Speed AFM
• 3 types with very high resonance frequencies (1.2 MHz - 5 MHz) and high force constants for dynamic mode applications in air
• 3 types with high resonance frequencies and low force constants (0.15 N/m – 0.6 N/m) mainly for applications in liquid.
• wear resistant High Density Carbon/Diamond Like Carbon (HDC/DLC) tip
• tip radius typically < 10 nm
• silicon nitride cantilevers and tips
• designed for various imaging applications in contact mode or dynamic mode
• oxide sharpened pyramidal tips
• tip radius typically < 10 nm
• available either with triangular or rectangular cantilevers
• also available as tipless version
• optimized positioning through maximized tip visibility
• three sided tip defined by real crystal planes
• special tip shape leads to very symmetric scans
• tip at the very end of the cantilever
• tip radius typically < 10 nm, guaranteed <15 nm
• also available as high speed version with a resonance frequency of up to 2 MHz