How to perform an AFM measurement in tapping mode in air on Bruker® AFM systems with Nanoscope® software, using PNP-TR AFM tips - NanoWorld®

Pyrex-Nitride oxide sharpened, pyramidal tip

This is a how-to-use step-by-step instruction on how to set up and scan in tapping mode in air using the respective NanoWorld® AFM probe.

This instruction is valid for the following NanoWorld® tapping mode AFM probes:

  • PNP-TR, small cantilever
  • PNP-TR-Au, small cantilever
  • PNP-DB, small cantilever
  • PNP-TRS
  1. Steps

  2. Step 1 - mount AFM probe and select AFM experiment

    • Mount AFM probe into AFM probe holder
    • In Choose an Experiment Category: select Tapping Mode
    • In Select Experiment Group: select TappingMode in Air
    • In Select Experiment: select TappingMode in Air - Standard
  3. Step 2 - select AFM probe

    • In Tapping in Air select Setup
    • In Probe I'll be using select New Probe of type
    • From dropdown menu select MLCT-E
  4. Step 3 - adjust laser and tune AFM cantilever

    • In Tapping in Air select Setup
    • Adjust laser on AFM cantilever
    • Adjust laser on detector
    • Maximize SUM signal
    • Tune AFM cantilever
  5. Step 4 - focus on sample / AFM tip reflection

    • In Tapping in Air select Navigate
    • In Focus Sample: select Sample (default) or Tip Reflection Focus on sample, respectively on AFM tip reflection, by moving the scan head up or down
  6. Step 5 - set scan size and engage AFM probe

    • In Tapping in Air select Check Parameters
    • Adjust Scan Size
    • Select Engage
  7. Step 6 - scan sample, check and adjust scan parameters

    • Scan the sample
    • Check and adjust Scan Size if needed
    • Check and adjust Scan Rate (i.e. scan speed) if needed
    • Check and adjust Integral Gain and Proportional Gain if needed

How to optimize your scan parameters? Click HERE for more information!


Bruker® and Nanoscope® are trademarks of Bruker Corporation

For detailed information about our AFM probe product series please see below: